Contamination Control for the Semiconductor and Microelectronics Industry
Particle Measuring Systems has the application expertise and industry-leading sensitivity particle monitoring instruments you need to reduce yield loss.
We provide the global expertise and high-performance laser particle counters you count on. We continuously count particles when and where products are at risk to determine how clean your semiconductor/microelectronics processes really are.
Particle Measuring Systems (PMS®) is the only company to reliably provide you with the highest particle counting sensitivity for chemicals, water, airborne, and molecular applications.
Industries
Compliance
Ultrapure Water UPW Contamination Control / 20 nm Particle Counting
Presented by Glen Slayter, Intel, and Dan Rodier, Particle Measuring Systems at the 2020 Ultrapure Micro event. Watch this case study on the benefits of and monitoring of particles in ultrapure water (UPW) as small as 20 nm. Learn more about the Ultra DI 20 Plus particle counter.
Only Particle Measuring Systems has proven and reliable 20 nm particle counting solutions for water and chemicals.
Related Resources
20 nm Chemical Batch Sampling Solution with the SLS-20 Syringe Sampler
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Understanding Nanoparticle Contamination in Ultrapure Water (UPW) Systems
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Troubleshooting for Liquid Particle Counting
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Particle Monitoring Strategies in UPW: 300 mm Fabs
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AMC Airborne Molecular Contamination Control in Clean Manufacturing Environments
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A practical Guide to Aerosol Particle Counter Matching
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