Semiconductor Device Parameter Analyzer - Keysight B1500A

Semiconductor device parameter analyzer – Keysight B1500A

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Features:

Switch between CV and IV measurements without re-cabling
Capture ultra-fast transient phenomena not possible with other conventional test instruments
Detect multi-frequency AC capacitance measurements from a range of 1 kHz to 5 MHz
Analyze data without an external PC using the intuitive 15-inch touch screen interface
Configure the B1500A with your choice of measurement modules, up to 10 slots in a box
Enjoy the 15-inch wide touch screen with intuitive EasyEXPERT group+ software

SPECIFICATIONS SEMICONDUCTOR DEVICE PARAMETER ANALYZER – KEYSIGHT B1500A

General technical data:
Max Output Coverage	200 V / 1 A
Max SMU Channels	10
Connector Type	Active guard triaxial
Min Measure Resolution	0.1 fA / 0.5 µV
Connectivity	GPIB, USB, LAN, VGA
Measurement capabilities	Current versus voltage (IV) measurement Capacitance measurement Pulsed IV/Fast IV/Transient IV measurement Pulse generation
Platform Features	15-inch touchscreen with embedded Windows 10 10 modular slots for configuration flexibility Interfaces: GPIB, USB, LAN, VGA video output Supports EasyEXPERT group+ software for characterization and automation
Specification conditions	Temperature: 23 °C ±5 °C Humidity: 20% to 60% Calibration period: 1 year
SMU integration time setting	1 PLC (1 nA to 1A range, voltage range) 20 PLC (100 pA range) 50 PLC (1 pA to 10 pA range) Averaging of high-speed ADC: 128 samples per 1 PLC
SMU filter	ON (for HPSMU, MPSMU and HRSMU)
SMU measurement terminal connection	Kelvin connection
WGFMU load capacitance	25 pF or less

Keysight B1500A

The Keysight B1500A is an advanced semiconductor device parameter analyzer designed for characterizing and evaluating the electrical properties of semiconductor devices. With its modular architecture, intuitive software, and industry-leading measurement accuracy, it is an ideal choice for semiconductor researchers, engineers, and manufacturers looking to evaluate and optimize device performance.