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Keysight E4991B Impedance Analyzer

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Highlights:

  • Three upgradable frequency options: 1 MHz to 500 MHz/1 GHz/3 GHz
  • Basic accuracy ±0.65% and 120 mΩ to 52 kΩ impedance range (10% measurement accuracy range)
  • Measurement parameters: |Z|, |Y|, θ, R, X, G, B, L, C, D, Q, |Γ|, Γx, Γy, θΓ, Vac, Iac, Vdc1, Idc1 (1. Option 001 is required)
  • Built-in DC bias (Option 001): 0 V to ±40 V, 0 A to ±100 mA
  • 4-channel & 4-trace on 10.4-inch color LCD with touch screen
  • Data analysis function: Equivalent circuit analysis, limit line test
  • Dielectric/magnetic material measurement (Option 002): |εr|, εr’, εr”, tanδ(ε), |μr|, μr’, μr”, tanδ(μ)
  • Temperature characteristics measurement (Option 007) and reliable on–wafer measurement (Option 010) capabilities
E4991B Impedance Analyzer

Keysight E4991B Impedance Analyzer – 1 MHz to 500 MHz / 1 GHz / 3 GHz

Keysight E4991B
Keysight E4991B

Overview

The Keysight E4991B is a high-performance impedance analyzer designed for electronic components, semiconductor devices, and materials characterization. With upgradable frequency options up to 3 GHz, wide impedance range, and advanced material measurement capabilities, it is ideal for both R&D and production testing.

Applications

• Characterization of passive components (L, C, R)
• Semiconductor device evaluation
• Dielectric and magnetic materials testing
• Temperature-dependent material analysis
• On-wafer and micro-component measurements

Technical Specifications

  • Frequency Options: 1 MHz to 500 MHz / 1 GHz / 3 GHz (upgradeable)

  • Accuracy: ±0.65% basic accuracy

  • Impedance Range: 120 mΩ to 52 kΩ (10% accuracy range)

  • Measurement Parameters: |Z|, |Y|, θ, R, X, G, B, L, C, D, Q, |Γ|, Γx, Γy, θΓ, Vac, Iac, Vdc¹, Idc¹ (Option 001 required)

  • Built-in DC Bias (Opt. 001): 0 V to ±40 V, 0 A to ±100 mA

  • Display: 10.4-inch color LCD, 4-channel / 4-trace with touch screen

  • Data Analysis: Equivalent circuit analysis, limit line test

  • Material Measurements (Opt. 002): |εr|, εr′, εr′′, tanδ(ε), |μr|, μr′, μr′′, tanδ(μ)

  • Temperature Characteristics (Opt. 007): Temperature-dependent material testing

  • On-Wafer Measurements (Opt. 010): Probe station connection kit up to 3 GHz

Key Features

  • Flexible upgradeable frequency coverage

  • Built-in DC bias for semiconductor and materials testing

  • Advanced dielectric and magnetic material measurement functions

  • Reliable on-wafer and micro-component testing with probe station kit

  • Works with Keysight N1500A-005 Material Measurement Suite for simplified setup and reporting (up to 1 GHz)

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